Insect attachment on waxy plant surfaces: the effect of pad contamination by different waxes

• Elena V. Gorb and
• Stanislav N. Gorb

Beilstein J. Nanotechnol. 2024, 15, 385–395, doi:10.3762/bjnano.15.35

• out using a load cell force sensor FORT-10 (10 g capacity; World Precision Instruments Inc., Sarasota, FL, USA) connected to a force transducer MP 100 (Biopac Systems Ltd., Santa Barbara, CA, USA) [24][46]. First, in order to make a test beetle incapable of flying, its elytra were glued together with

• a small drop of molten beeswax. At the same time, a 10–15 cm long human hair was stuck to the wax drop. After the wax had hardened and the insect recovered from the treatment, a free end of the hair was attached to the force sensor. Then, the tethered beetle walked on a horizontally placed test

Design, fabrication, and characterization of kinetic-inductive force sensors for scanning probe applications

• August K. Roos,
• Ermes Scarano,
• Elisabet K. Arvidsson,
• Erik Holmgren and
• David B. Haviland

Beilstein J. Nanotechnol. 2024, 15, 242–255, doi:10.3762/bjnano.15.23

• microscopy based on electromechanical coupling due to a strain-dependent kinetic inductance of a superconducting nanowire. The force sensor is a bending triangular plate (cantilever) whose deflection is measured via a shift in the resonant frequency of a high-Q superconducting microwave resonator at 4.5 GHz

• . We present design simulations including mechanical finite-element modeling of surface strain and electromagnetic simulations of meandering nanowires with large kinetic inductance. We discuss a lumped-element model of the force sensor and describe the role of an additional shunt inductance for tuning

• (KIMEC) sensors. A force sensor designed specifically for scanning probe microscopy must have a sharp tip that is readily positioned and scanned over a surface. We operate the sensor near a mechanical resonance with a high quality factor Q for enhanced responsivity to force. The mechanical resonator is a

High–low Kelvin probe force spectroscopy for measuring the interface state density

• Ryo Izumi,
• Masato Miyazaki,
• Yan Jun Li and
• Yasuhiro Sugawara

Beilstein J. Nanotechnol. 2023, 14, 175–189, doi:10.3762/bjnano.14.18

• concentrations of the n, p, and n+ regions are 1 × 1015 cm−3, 2 × 1016 cm−3, and 5 × 1019 cm−3, respectively. As a force sensor, a PtIr-coated conductive cantilever (NanoWorld: NCHPt) was used. The resonance frequency f0, force constant k, and Q of the PtIr-coated cantilever were 292.68 kHz, 42 N/m, and 8406

A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy

• Hao Liu,
• Zuned Ahmed,
• Sasa Vranjkovic,
• Manfred Parschau,
• Andrada-Oana Mandru and
• Hans J. Hug

Beilstein J. Nanotechnol. 2022, 13, 1120–1140, doi:10.3762/bjnano.13.95

• tuning fork force sensor became increasingly popular. In comparison to microfabricated cantilevers, the more macroscopic tuning forks, however, lack sensitivity, which limits the measurement bandwidth. Moreover, multimodal and multifrequency techniques, such as those available in cantilever-based AFM

• measurement bandwidth. For a hard cantilever and, likewise, for a tuning fork sensor, the deflection noise can become the dominant noise source, such that a low stiffness-to-resonance frequency ratio becomes particularly relevant. Note that the oscillator noise (Equation 3) depends on the noise of the force

• sensor neq, the cantilever stiffness ki, and the quality factor Qi, but not on the resonance frequency fi of the cantilever. Hence, different from the thermal and detector noise terms, having a high resonance frequency is not beneficial. However, as Kobayashi already pointed out [59], the oscillator

Quantitative dynamic force microscopy with inclined tip oscillation

• Philipp Rahe,
• Daniel Heile,
• Reinhard Olbrich and
• Michael Reichling

Beilstein J. Nanotechnol. 2022, 13, 610–619, doi:10.3762/bjnano.13.53

• (Figure 1a). In its relaxed state, the z piezo and the force sensor have a length of and respectively. Applying a voltage to the z-piezo results in an extension of the piezo length lp that is described as a piezo position zp on the separate axis zp with unit vector and with the origin chosen to

Reducing molecular simulation time for AFM images based on super-resolution methods

• Zhipeng Dou,
• Jianqiang Qian,
• Yingzi Li,
• Rui Lin,
• Jianhai Wang,
• Peng Cheng and
• Zeyu Xu

Beilstein J. Nanotechnol. 2021, 12, 775–785, doi:10.3762/bjnano.12.61

• and 0.1 Å vertical resolution [3]. Then, functionalizing the tip with closed-shell molecules and using a qPlus force sensor enabled the imaging of the internal structure of the molecules [4][5][6][7], resolving features of weak-bonded molecules [8][9][10][11][12], and measurement of bond-order

Paper-based triboelectric nanogenerators and their applications: a review

• Jing Han,
• Nuo Xu,
• Yuchen Liang,
• Mei Ding,
• Junyi Zhai,
• Qijun Sun and
• Zhong Lin Wang

Beilstein J. Nanotechnol. 2021, 12, 151–171, doi:10.3762/bjnano.12.12

• , including acoustic [103], pressure/force/weight [129][145][146], velocity/acceleration [136][147], position [148], anti-theft [149], and temperature [145] sensors. Liu et al. [146] reported a self-powered active P-TENG force sensor with an ionogel-infiltrated paper (IIP) as the electrode, aiming for a

Numerical analysis of vibration modes of a qPlus sensor with a long tip

• Kebei Chen,
• Zhenghui Liu,
• Yuchen Xie,
• Chunyu Zhang,
• Gengzhao Xu,
• Wentao Song and
• Ke Xu

Beilstein J. Nanotechnol. 2021, 12, 82–92, doi:10.3762/bjnano.12.7

• temperature range [1]. In addition, quartz tuning forks have a high elastic constant, a high quality factor (Q factor), and are self-sensing due to the piezoelectric effect [1]. Therefore, a quartz tuning fork can be used as a force sensor. The central part of the “qPlus sensor” is a quartz tuning fork of

Nanoscale spatial mapping of mechanical properties through dynamic atomic force microscopy

• Zahra Abooalizadeh,
• Leszek Josef Sudak and
• Philip Egberts

Beilstein J. Nanotechnol. 2019, 10, 1332–1347, doi:10.3762/bjnano.10.132

• the force sensor were determined under ultrahigh vacuum using the beam-geometry method, involving the measurement of the frequency of the first normal oscillation mode to determine the thickness of the cantilever [26]. The normal stiffness of the cantilevers was determined to be in the range of 0.25

Dumbbell gold nanoparticle dimer antennas with advanced optical properties

• Janning F. Herrmann and
• Christiane Höppener

Beilstein J. Nanotechnol. 2018, 9, 2188–2197, doi:10.3762/bjnano.9.205

• maintained with sub-nanometer accuracy to 2–4 nm by means of a force feedback loop regulating on the frequency shift of the force sensor, which is excited at its resonance frequency. The fluorescence emission rate as a function of the antenna–sample distance is recorded with the feedback loop switched off

• formed of spherical AuNPs attached to a sharply pointed glass tip. Inset: Magnification to the gap region showing the aligned CB[n]s on the NP surfaces, which results in a sub-nanometer gap distance. (C) Macroscale picture of a glass tip attached to a piezoelectric quartz tuning fork acting as a force

• sensor. Inset: SEM image of the CB[n] mediated dimer antenna attached to the pointed end of the glass tip. Scale bar: 100 nm. Antenna-enhanced fluorescence images of randomly distributed high-QY emitters on a glass surface imaged with dimer antennas with a gap size of 1.5 nm (A) and 1 nm (B), and a

Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis

• Omur E. Dagdeviren and
• Udo D. Schwarz

Beilstein J. Nanotechnol. 2017, 8, 657–666, doi:10.3762/bjnano.8.70

• enable the simultaneous collection of local forces and tunneling currents, the exact realization of this wire connection has a major effect on sensor properties such as spring constant, quality factor, resonance frequency, and its deviation from an ideal vertical oscillation. Keywords: force sensor

Influence of ambient humidity on the attachment ability of ladybird beetles (Coccinella septempunctata)

• Lars Heepe,
• Jonas O. Wolff and
• Stanislav N. Gorb

Beilstein J. Nanotechnol. 2016, 7, 1322–1329, doi:10.3762/bjnano.7.123

• were recorded with the AcqKnowledge 3.7.0 software (Biopac Systems Inc.). A half Plexiglas tube was installed inside the chamber, in order to guide beetle locomotion perpendicular to the force sensor and prevent it from climbing onto the lateral walls. Prior to experiments the beetles were anesthetized

• with carbon dioxide and the elytra were glued together with a droplet of molten wax, to prevent them from flying (for details see [40]). Individual beetles were connected to the force transducer by a human hair (10–15 cm long) fixed to the elytra and to the force sensor with a droplet of molten wax

• . Beetles were placed on the Plexiglas bottom of the experimentation chamber and released such that they walk perpendicularly away from the force sensor. When the beetles were hold back by the strengthened hair they tried to pull forward, which led to transmission of traction forces to the force sensor. The

Length-extension resonator as a force sensor for high-resolution frequency-modulation atomic force microscopy in air

• Hannes Beyer,
• Tino Wagner and
• Andreas Stemmer

Beilstein J. Nanotechnol. 2016, 7, 432–438, doi:10.3762/bjnano.7.38

Determination of Young’s modulus of Sb₂S₃ nanowires by in situ resonance and bending methods

• Liga Jasulaneca,
• Raimonds Meija,
• Alexander I. Livshits,
• Juris Prikulis,
• Subhajit Biswas,
• Justin D. Holmes and
• Donats Erts

Beilstein J. Nanotechnol. 2016, 7, 278–283, doi:10.3762/bjnano.7.25

• test [21][22] and nanoindentation [23]. In situ techniques stand out among other methods for mechanical characterization due to their capability of real-time monitoring of the elastic response of the NWs. Bending tests with a use of external force sensor [24], tensile deformation [25][26] as well as

Development of a novel nanoindentation technique by utilizing a dual-probe AFM system

• Eyup Cinar,
• Ferat Sahin and
• Dalia Yablon

Beilstein J. Nanotechnol. 2015, 6, 2015–2027, doi:10.3762/bjnano.6.205

• point of contact detection measurement of tuning forks. Oiko et al. recently demonstrated the development of nanoindentation probes that can be manipulated inside a scanning electron microscope (SEM) [13]. This system also utilizes tuning-fork technology, which can be used as an ultra-sensitive force

• sensor owing to the very high quality factors of tuning forks. They perform in situ nanoindentation experiments on multi-walled carbon nanotube bundles, however, the displacement data is only obtained from the SEM images limiting the high accuracy of displacement reading and the true depth sensing during

Improved atomic force microscopy cantilever performance by partial reflective coating

• Zeno Schumacher,
• Yoichi Miyahara,
• Laure Aeschimann and
• Peter Grütter

Beilstein J. Nanotechnol. 2015, 6, 1450–1456, doi:10.3762/bjnano.6.150

• S2 and Figure S3. In force measurements the force noise is more relevant than the deflection noise itself as it directly shows the performance of the cantilevers as a force sensor (see Figure 3a). The equivalent force noise density spectra were obtained by multiplying the deflection noise density

Mechanical properties of sol–gel derived SiO₂ nanotubes

• Boris Polyakov,
• Mikk Antsov,
• Sergei Vlassov,
• Leonid M Dorogin,
• Mikk Vahtrus,
• Roberts Zabels,
• Sven Lange and
• Rünno Lõhmus

Beilstein J. Nanotechnol. 2014, 5, 1808–1814, doi:10.3762/bjnano.5.191

• measured by using different methods. In situ scanning electron microscopy (SEM) cantilever beam bending tests were carried out by using a nanomanipulator equipped with a force sensor in order to investigate plasticity and flexural response of NTs. Nanoindentation and three point bending tests of NTs were

• in place during the bending. Cantilever beam bending technique [23][24] was applied to half-suspended NTs inside a TESCAN Vega-II SBU SEM equipped with a x,y,z-nanomanipulator (SLC-1720-S, SmarAct) and a force sensor. The force sensor was made by gluing an AFM cantilever with a sharp tip (ATEC-CONT

• mechanical characterization of thick-walled NTs with limited elasticity. Conclusion In this work we measured the Young’s modulus of SiO2 nanotubes by using three different methods. Half-suspended bending tests were carried out inside a SEM by using a nanomanipulator equipped with force sensor. The average

Measuring air layer volumes retained by submerged floating-ferns Salvinia and biomimetic superhydrophobic surfaces

• Matthias J. Mayser,
• Holger F. Bohn,
• Meike Reker and
• Wilhelm Barthlott

Beilstein J. Nanotechnol. 2014, 5, 812–821, doi:10.3762/bjnano.5.93

• level in an aquarium filled with water. A metal needle (40 mm length, 0.4 mm diameter, V2A steel) was bent into an L-shape and glued to the end of the beam with resin glue resulting in the tip of the needle being submerged 20 mm below the water surface. All specimens were mounted to the force sensor by

• of submerged air per Volt assuming a water density of 1 mg/µL. The maximum sensitivity of the measurement was 0.09 µL. For proper mounting to the force sensor specimens had to possess negative buoyancy when submerged under water. Thus, Salvinia leaves along with additional weights were glued onto a

Calibration of quartz tuning fork spring constants for non-contact atomic force microscopy: direct mechanical measurements and simulations

• Jens Falter,
• Marvin Stiefermann,
• Gernot Langewisch,
• Philipp Schurig,
• Hendrik Hölscher,
• Harald Fuchs and
• André Schirmeisen

Beilstein J. Nanotechnol. 2014, 5, 507–516, doi:10.3762/bjnano.5.59

• ” sensors. The stiffness of the force sensor is necessary for the transformation of the experimental frequency shift data, Δf, to forces. Consequently, a force measurement can only be as precise as the determination of each factor in the equation that links the frequency shift to the tip–sample forces [8

• negligible angle between the tip wire axis and the surface normal of the tuning fork prong. Results and Discussion Experiment The quartz tuning fork, originally used as frequency normal in wrist watches constitutes the centerpiece of a force sensor in the “qPlus” design. Figure 1 shows micrographs from

Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures

• Florian Pielmeier,
• Daniel Meuer,
• Daniel Schmid,
• Christoph Strunk and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2014, 5, 407–412, doi:10.3762/bjnano.5.48

• eigenfrequency of the force sensor is of key importance for highest precision force measurements. Here, we study the influence of temperature changes on the resonance frequency of force sensors made of quartz, in a temperature range from 4.8–48 K. The sensors are based on the qPlus and length extensional

• beneficial for a stable operation of the force sensor to avoid temperatures around 13 ± 0.5 K. In the last part, the benefits of the custom designed qPlus sensors C and Ct are briefly discussed. They exhibit higher and more reliable Q values, this is attributed to the larger base of the sensor. The clamping

Manipulation of nanoparticles of different shapes inside a scanning electron microscope

• Boris Polyakov,
• Sergei Vlassov,
• Leonid M. Dorogin,
• Jelena Butikova,
• Mikk Antsov,
• Sven Oras,
• Rünno Lõhmus and
• Ilmar Kink

Beilstein J. Nanotechnol. 2014, 5, 133–140, doi:10.3762/bjnano.5.13

• ) equipped with a custom-made force sensor. The force sensor was made by gluing an electrochemically sharpened tungsten wire or commercial AFM cantilever with a sharp tip (Nanosensor ATEC-CONT cantilevers C = 0.2 N/m) to one prong of a commercially available quartz tuning fork (QTF). The tip of ATEC-CONT

• Information contains details of SmarAct manipulator working regimes, the QTF force sensor calibration and calculations of the surface areas for different geometries. Supporting Information File 56: Additional experimental details. Acknowledgements This work was supported by the ESF project Nr. 2013/0202/ 1DP

k-space imaging of the eigenmodes of sharp gold tapers for scanning near-field optical microscopy

• Martin Esmann,
• Simon F. Becker,
• Bernard B. da Cunha,
• Jens H. Brauer,
• Ralf Vogelgesang,
• Petra Groß and
• Christoph Lienau

Beilstein J. Nanotechnol. 2013, 4, 603–610, doi:10.3762/bjnano.4.67

• is controlled using a tuning fork-based force sensor in a noncontact-mode atomic force microscope (AFM). This microscope is a modified version of the setup described in [10]. The taper probe is attached to one prong of a quartz tuning fork that oscillates with a peak-to-peak amplitude of 1 nm. The

Optimal geometry for a quartz multipurpose SPM sensor

• Julian Stirling

Beilstein J. Nanotechnol. 2013, 4, 370–376, doi:10.3762/bjnano.4.43

• microscopes (AFM) and lateral force microscopes (LFM), however, the sensor is more complex. The atomically sharp probe must be combined with a force sensor, usually a cantilever, with either piezoelectric or optical deflection detection. For noncontact AFM (NC-AFM) and dynamic LFM (DLFM), where the sensor is

• closest commercially available sensor is a double-ended tuning fork available from Statek (DETF Force Sensor, http://www.statek.com). By fixing the bottom tine it is possible to reproduce the required symmetry. However, these sensors are too large for most commercial qPlus systems with a total width of

Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

• Jannis Lübbe,
• Matthias Temmen,
• Sebastian Rode,
• Philipp Rahe,
• Angelika Kühnle and
• Michael Reichling

Beilstein J. Nanotechnol. 2013, 4, 32–44, doi:10.3762/bjnano.4.4

• of Gfilter can be set by the user according to the needs of the experiment. Noise in NC-AFM consists mainly of three contributions: noise arising from the thermal excitation of a cantilever or another force sensor, noise caused by the detection system and signal processing electronics [3][4], and

Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy

• Joachim Welker,
• Esther Illek and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2012, 3, 238–248, doi:10.3762/bjnano.3.27

• , Equation 10) for an FM-AFM force sensor. The calculated frequency-shift curves are deconvoluted back to a force curve FS/M by using the Sader–Jarvis (S) and the matrix (M) method, respectively. In order to compare the two deconvolution methods for different force laws, we need a measure for the